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| We propose our probing solution for Multi-Layer Ceramic Capacitor (MLCC). |
| Probing Solution for Multi-Layer Ceramic Capacitor（MLCC) |
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Measures the MLCCs sticked on the film frame by chip placement machine. |
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Measures the capacity and insulation resistance, etc. by the Sequential Probing. （※1） |
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In-house development of the probing system is also available.（※2） |
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Product Size : Min. 0.4mm x 0.2mm
(Placement Accuracy : Please contact our sales department) |
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Multi-products probing : 40pcs (2 x 20) |
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Even if the number of chips on the Frame is less than the specified number,
it can be supported. (Available only for the last film frame) |
Divide the measurement items into several groups and prepare a probe card with the function to measure each group.
For example, a probe for measuring CAP(Capacitance) and a probe for measuring IR (Insulation Resistance) are set on one probe card.
CAP (Capacitance) is measured by the first index, and both CAP and IR (Insulation Resistance) are measured by the next index.
The measurement is performed by repeating this sequentially.
For details, please contact our sales department. |
| CAP |
：Capacitance |
| IR |
：Insulation Resistance |
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| ※2 In-house Development of Measurement System |
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| We will develop the measurement system by combining benchtop instruments
on the market. |
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