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| [Wafer Process] |
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Wafer Probers
PCP-102SL / PCP-302N
Features
Full automatic probe system, available for Semi-auto.
Probe position compensation by automatic
die size scaling ensures the Reliable Contact.
Wafer Size
100mm (4 inch) to 300mm (12 inch)
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| For Probe Card |
For RF-positioner |
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Double Sided Wafer Prober
PCP-102WS
Features
Enable to contact both the Pad on the wafer top and bottom (double side)
simultaneously
High Voltage & Current Power Device testing
Full auto "Contact Checker Unit" for fail safe
Wafer Size
100mm (4 inch) to 200 mm (8 inch)
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Probing Handlers for Diced Special Form
PCP-103SL / PCP-303N
Features
Probing position compensation
X & Y linear motor technology for reliability
and performance
Multi-area Alignment
Frame Size
2-6-1, 2-8-1 and 2-12
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| ※1 Supports 6 inch by changing the chuck (Option) |
| ※2 Supports 8 inch by changing the chuck (Option) |
| Spec difference of Wafer Probers |
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| Spec difference of Probing Handlers |
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You can edit the probing coordinates, probe position data, etc. by your
personal computer（*1）!
PCP Off-line Editor
Features
Setting of probing coordinates, etc. which takes time can be done without stopping the operation of PCP series.
*1: Windows OS only. |
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This is the dedicated system, built with the probing system (PCP series)
and power supplies or measuring instruments available on the market such
as meter, to control both by using a dedicated PC.
Measurement System
Features
This system is available for the measurement not only for mass-production,
but also for research & development and for the measurement with the
specifications required by customer. |
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