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| [Wafer Process] |
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Wafer Prober
PCP-102SL / PCP-302N
Features
Full automatic probe system, available for Semi-auto.
Probe position compensation by automatic
die size scaling ensures the Reliable Contact.
Wafer Size
100mm (4 inch) to 300mm (12 inch)
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| For Probe Card |
For RF-positioner |
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Double Sided Wafer Prober
PCP-102WS
Features
High Voltage & Current Power Device testing
Full auto "Contact Checker Unit" for fail safe
Wafer Size
100mm (4 inch) to 200 mm (8 inch)
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Wafer Laser Marking System
PCP-LM8
Feature
Engrave letters and barcodes with lasers on the back of the wafer
Wafer Size
150 mm (6 inch), 200 mm (8 inch) |
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Probing Handler for Diced Special Form
PCP-103SL / PCP-303N
Features
Probing position compensation
X & Y linear motor technology for reliability
and performance
Multi-area Alignment
Frame Size
2-6-1, 2-8-1 and 2-12
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| ※1 Supports 6 inch by changing the chuck (Option) |
| ※2 Supports 8 inch by changing the chuck (Option) |
| Wafer Prober |
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| Probing Handler |
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Custom-made Measurement System
Developing Measurement Software
Features
Combining our probing system (PCP series) and commercially available measuring instruments such as power supplies and meters, and using a dedicated PC, we build a dedicated system that controls both. |
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You can edit the probing coordinates, probe position data, etc. by your personal computer（*1）
PCP Off-line Editor
Features
Setting of probing coordinates, etc. which takes time can be done without stopping the operation of PCP series.
*1: Windows OS only. |
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