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PCP Series


We provide Probers to measure a wafer.
→ PCP-102SL → PCP-302N
→ PCP-102NT → PCP-302NT
→ PCP-102WS
Spec difference of Wafer Probers
We provide Probing Handlers to measure the diced products WLCSP, package substrates (BGA, QFN, etc.)
→ PCP-103SL → PCP-303N
Spec difference of Probing Handlers

Software product we developed.
→ PCP Off-line Editor
→ Measurement System


→ Manual Prober
→ Positioner
→ Inker Unit
→ Ink Dispenser
→ Probe Card

We will show you the introduction results of our Wafer Probers and Probing Handlers.



Special Topic


Special Topic

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