| PCP Series Wafer Prober / Probing Handler |
| Developing Measurement Software |
| Custom-made Measurement System |
Combining our probing system (PCP series) and commercially available measuring
instruments such as power supplies and meters, and using a dedicated PC,
we build a dedicated system that controls both.
In addition to mass production use, measurements can be made with specifications
that meet R&D and customer needs. |
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| Evaluation of process characteristics of superconducting devices at room
temperature |
| Used with: Multimeter , Source Measure Unit , Picoampere Meter |
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| High resistance and insulation resistance measurement for each process
of superconducting devices. |
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SAW Filter Characteristics Measurement
for Mobile Phone |
| Used with: Network analyzer |
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| The system measures filter characteristics such as center frequency and
minimum insertion loss. |
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| Laminated Capacitor’s Capacity Measurement |
| Used with: LCR meter, High voltage power supply, PLC |
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| The system outputs measurement trigger at regular intervals with an accuracy
of 0.5 msec or less and measures the capacity. |
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Frequency Measurement
for Communication/Clock Modules |
| Used with: Network analyzer |
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| The system measures resonant frequency, impedance, and equivalent constant. |
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Automotive Acceleration Sensor Measurement,
Electrical Capacitive Pressure Sensor Measurement |
| Used with: LCR meter |
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| The system changes the bias voltage and measures the capacitance by the
capacitance detection method. |
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| I-V Characteristics Measurement for Photodiode (PD, APD) |
| Used with: SMU |
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| The system measures reverse and forward I-V characteristics by voltage
sweep measurement. |
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