Top Products Software Measurement System

PCP Series Wafer Prober / Probing Handler
Measurement System




Outline

The dedicated system is built, combining the probing system (PCP series) with power supplies or measuring instruments available on the market such as meter, that controls both by using a dedicated PC.
This system is available for the measurement not only for mass-production, but also for research & development and for the measurement with the specifications required by customer.


Example of Use

SAW Filter Characteristics Measurement
for Mobile Phone
Used with: Network analyzer
The system measures filter characteristics such as center frequency and minimum insertion loss.
Laminated Capacitor’s Capacity Measurement
Used with: LCR meter, High voltage power supply, PLC
The system outputs measurement trigger at regular intervals with an accuracy of 0.5 msec or less and measures the capacity.
Frequency Measurement
for Communication/Clock Modules
Used with: Network analyzer
The system measures resonant frequency, impedance, and equivalent constant.
Automotive Acceleration Sensor Measurement,
Electrical Capacitive Pressure Sensor Measurement
Used with: LCR meter
The system changes the bias voltage and measures the capacitance by the capacitance detection method.
I-V Characteristics Measurement for Photodiode (PD, APD)
Used with: SMU
The system measures reverse and forward I-V characteristics by voltage sweep measurement.

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