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PCP Series


We provide Probers to measure a wafer.
PCP-102SL PCP-302N
PCP-102NT PCP-302NT
PCP-102WS
Spec difference of Wafer Probers
We provide Probing Handlers to measure the diced products WLCSP, package substrates (BGA, QFN, etc.)
PCP-103SL PCP-303N
Spec difference of Probing Handlers

Software product we developed.
PCP Off-line Editor


Manual Prober
Positioner
Inker Unit
Ink Dispenser
Probe Card

We will show you the introduction results of our Wafer Probers and Probing Handlers.



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